VCSEL Industry. Babu Dayal Padullaparthi
Чтение книги онлайн.

Читать онлайн книгу VCSEL Industry - Babu Dayal Padullaparthi страница 19

Название: VCSEL Industry

Автор: Babu Dayal Padullaparthi

Издательство: John Wiley & Sons Limited

Жанр: Техническая литература

Серия:

isbn: 9781119782216

isbn:

СКАЧАТЬ target="_blank" rel="nofollow" href="#fb3_img_img_ae6a34c9-e0b8-55e9-b95b-a632917f6b87.png" alt="left-parenthesis lamda slash 2 n right-parenthesis q equals upper L period"/>

      Now, in a laser cavity with a resonator length L longer than the wavelength, waves of many wavelengths with slightly different lengths can resonate. These modes are called longitudinal modes. On the other hand, the modes in the perpendicular direction are called the transverse modes.

      Considering a normal semiconductor laser, if λ is 1.3 μm, n = 3.5, and L = 3 μm, then q = 16.

      Therefore, even if q differs by 1, the resonance wavelength changes only slightly as Δλ. With |Δ λ | ≪̸ λ in mind, if λ λ 0 + Δλ , qq + 1, then we obtain,

      (1.8)StartFraction upper Delta lamda Over lamda 0 EndFraction equals minus 2 StartFraction lamda 0 Over n Subscript e f f Baseline upper L EndFraction period

      This |∆ λ | is called free spectral range (FSR) and is inversely proportional to cavity length, L.

      Here, neff is the effective index considering the dispersion of the medium and is given by the following expression:

      (1.9)n Subscript e f f Baseline equals n left-brace 1 minus left-parenthesis lamda 0 slash n right-parenthesis left-parenthesis partial-differential n slash partial-differential lamda right-parenthesis vertical-bar Subscript lamda equals lamda 0 Baseline right-brace period

      Since ∂n/∂ λ < 0 in ordinary semiconductors, neff is usually larger than n. In the above example, neff = 4.0 and |∆ λ | = 70 nm.

      1.1.5.3 Cavity Formation

      In Table 1.1 we have touched on DFB and DBR structures for single‐mode operation of edge‐emitting lasers [20–23]. In both cases, we utilize a pair of Bragg mirrors having an electric field reflectivity expressed by r equals StartRoot upper R EndRoot exp left-parenthesis minus j phi right-parenthesis that sandwich some space or active region. These wavelength‐selective cavities can provide single longitudinal‐mode operation. For using those lasers in optical pulse code modulation (PCM) for optical fiber communications, they should maintain single mode under high‐speed modulation (~100 Gb/s). Moreover, in the case of coherent digital communications, the laser should operate with narrow spectrum (~kHz). This kind of lasers is called a dynamic single‐mode laser [24].

      In the case of VCSELs the mirrors are formed by semiconductor Bragg reflectors or dielectric mirrors, and therefore, we can design the resonator as open or short terminations. We can use its large free spectral range (FSR) for pure single longitudinal‐mode operation and wide‐range wavelength tuning. The details will be described in Chapters 2 and 8.

      1.2.1 Manufacturing Process of Edge‐Emitting Lasers

      The FP‐EELs with cleaved laser mirrors have only 33% reflectivity. The reflectivity of the cleaved surface can be modified to be either higher or lower reflectivity by coating multi‐layer films that can be used to optimize the performance characteristics and to protect the surfaces of the EEL. The facet coatings are applied after the lasers are cleaved from the substrate and require extensive handling, which makes them more difficult to manufacture.

      Another approach is to form the distributed reflectors through multiple epitaxial steps with intermediate fabrication steps. The regrowth and the intermediate processing result in a nonmonolithic epitaxial growth making this process very complex and not manufacturing‐friendly compared to a fully monolithic VCSEL fabrication.

Schematic illustration of the manufacturing processes of edge-emitting lasers.

      Source: Figure by K. Iga and J. A. Tatum [copyright reserved by authors].

      1.2.2 Vertical‐Cavity Surface‐Emitting Laser

Schematic illustration of the manufacturing and testing processes of VCSELs.

      Source: Figure by K. Iga and J. A. Tatum [copyright reserved by authors].