Название: Measurement Technology for Micro-Nanometer Devices
Автор: Zongmin Ma
Издательство: John Wiley & Sons Limited
Жанр: Техническая литература
isbn: 9781118717981
isbn: 0
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices