Advanced Characterization Techniques for Thin Film Solar Cells. Uwe Rau

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Название: Advanced Characterization Techniques for Thin Film Solar Cells

Автор: Uwe Rau

Издательство: John Wiley & Sons Limited

Жанр: Прочая образовательная литература

Серия:

isbn: 9783527699018

isbn: 0

Аннотация:

The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.