Fringe Pattern Analysis for Optical Metrology. Theory, Algorithms, and Applications. Manuel Servin

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Название: Fringe Pattern Analysis for Optical Metrology. Theory, Algorithms, and Applications

Автор: Manuel Servin

Издательство: John Wiley & Sons Limited

Жанр: Техническая литература

Серия:

isbn: 9783527681082

isbn: 0

Аннотация:

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.