Applications and Metrology at Nanometer-Scale 2. Abdelkhalak El Hami

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       Reliability of Multiphysical Systems Set

      coordinated by

      Abdelkhalak El Hami

      Volume 10

      Applications and Metrology at Nanometer Scale 2

       Measurement Systems, Quantum Engineering and RBDO Method

      Pierre Richard Dahoo

      Philippe Pougnet

      Abdelkhalak El Hami

      First published 2021 in Great Britain and the United States by ISTE Ltd and John Wiley & Sons, Inc.

      Apart from any fair dealing for the purposes of research or private study, or criticism or review, as permitted under the Copyright, Designs and Patents Act 1988, this publication may only be reproduced, stored or transmitted, in any form or by any means, with the prior permission in writing of the publishers, or in the case of reprographic reproduction in accordance with the terms and licenses issued by the CLA. Enquiries concerning reproduction outside these terms should be sent to the publishers at the undermentioned address:

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