Название: Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques
Автор: Отсутствует
Издательство: John Wiley & Sons Limited
Жанр: Зарубежная образовательная литература
isbn: 9783527639564
isbn: 0
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.